Page 7 - Combined_41_OCR
P. 7

VIBRATION TESTING


          simplest means of sensing and measuring accelera­
          tion. Such a system consists of strain gages ce­
          mented to the top and bottom surfaces of a beam
          and connected electrically to a simple meter, Fig. 2.          Tension
                                                                         gages (4)
          Acceleration of the base up and down changes                                               Motion
          the resistance of the gages, which is reflected pro­
          portionally on the meter.
            For very low frequencies—up to about 0.5 Hz—
          the d-c-sensing meter of Fig. 2 could be used. The
          pointer would be centered for zero acceleration. It
          would swing left for upward acceleration and right
          for downward acceleration. But if the vibration
          frequency were increased beyond this range, the
          pointer could not follow the signal but would
          merely quiver about zero. An a-c-sensing meter        Fig. 3—Simplified piezoresistive accelerometer.
                                                                This sensor operates on the same principle as
          would be needed.                                      a strain-gage accelerometer, except that the strain
            Another limitation of this simple SGA stems         gages are replaced with four small bits of semi­
          from its natural frequency. As the test frequency     conductor material.
          approaches fN of the SGA, readings will be higher
          even though peak acceleration is held constant—
          because of resonance of the sensor.

            Piezoresistive (PR) accelerometers are similar
          in principle to strain-gage accelerometers, Fig. 3.
                                                                                                   —o
          They are, however, much more rugged; full output
                                                                                                   Signal out
          at 2500 g is typical.                                                                    ——o
            Some PR and strain-gage accelerometers can be
          operated with a “carrier” a-c voltage, rather than
          with a d-c voltage. The carrier is amplitude-mod­
          ulated by the action of the accelerometer. This
          type of electrical signal is more easily amplified                                        —o
          (especially at very low frequencies), but must be                                         Power in
                                                                                                    —o
          demodulated prior to readout.
                                                                      I IVRUp
            Servo accelerometers are force-balance or force-       Force-rebalance coil
          rebalance accelerometers, Fig. 4. They are partic­    Fig. 4—Servo (force-rebalance) accelerometer.
          ularly suited for measurement of very low (to         When acceleration of the case moves the mass
                                                                from its rest position, the displacement pickup
          zero) frequency motion and extremely low levels       sends a signal to the servo amplifier. The ampli­
          of acceleration—to less than one millionth of a g.    fier current (to the force-rebalance coil) exactly
          Accuracies of better than one part per million have   balances the inertial force on the mass while
          been achieved; these are particularly valuable for    furnishing a proportional output signal.
          inertial navigation.





                                                                                 Piezoelectric crystal bar

                                    Battery
                                                              Motion
                       Gage /r^
                Motion  Gage R2         pi    0
                                               D“C
                                             voltmeter                                             ---------o
                      ’’-"Base      t                                                              Signal out
                                                                                                   --------o
                          Vibrating
                          structure                                     Test structure
                                                                Fig. 5—Simplified piezoelectric (crystal) ac­
             Fig. 2—Simplified strain-gage accelerometer. Ac­   celerometer. Bending, shear, or compressive in­
             celeration on base deflects cantilevered beam due   ertia forces—depending on the specific accelero­
             to inertia of W, which, in turn, changes strain­   meter—generate an emf in the piezoelectric
             gage resistances Ri and R2.                        crystal.




          May 29, 1969                                                                                121
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